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Winter Logic (previously Provis) specializes in high performance software-based fault simulation for functional vectors. Our customers use our Z01X Fault Simulator for measuring total coverage on non-scan designs and supplementing ATPG coverage with functional vectors for scan-based designs. Our target customer develops chips for applications that require high quality parts, typically less than 500 DPM and in some cases less than 50 DPM (implantable medical devices, military applications, automotive control and high volume products such as disk drive electronics). Our proprietary Expert Test System includes Testability Analysis to provide optimum test ordering, eliminate redundant tests and report on uncovered areas of the design, all prior to fault simulation. Z01X provides high performance, high capacity fault simulation. Z01X offers the best overall defect analysis capability in the EDA industry. Our fault models include stuck-at faults, transition faults and bridge faults.

Z01X Fault Simulator

Z01X is the fastest, highest-capacity fault simulator for functional vectors available bar none. Z01X provides both logic and fault simulation, and is the only Verilog fault simulator that has the capability of simulating stuck-at faults, transition faults and bridge faults. Z01X applications include fault simulation of non-scan designs, BIST designs and scan based designs with functional vectors. Z01X also supports a parallel load methodology for simulating ATPG vectors.

Key Features
  • FAST --- Z01X is many times faster than competing fault simulation products, compare designs fault simulated by Z01X in 2 days that took the primary competing product 4 weeks.
  • POWERFUL --- Our Master/Slave licensing allows fault simulation tasks to be divided over multiple host machines to achieve the desired performance.
  • ACCURATE --- Good machine simulation results match the Verilog-XL standard. Fault detection results match the Verifault standard. Full-timing capability for both logic and fault simulation including SDF annotation. In tests for accuracy, Z01X matches ATPG stuck-at detection using ATPG vectors for all categories (detected, undetected, potential).
  • EASY --- No re-modeling of design required with full Verilog language support. Z01X includes automatic dynamic test ordering optimization, a straightforward fault simulation environment and data management when using multiple servers.
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