Winter Logic (previously Provis) specializes in high performance software-based fault simulation for functional vectors.
Our customers use our Z01X Fault Simulator for measuring total coverage on non-scan designs and supplementing ATPG coverage
with functional vectors for scan-based designs. Our target customer develops chips for applications that require high
quality parts, typically less than 500 DPM and in some cases less than 50 DPM (implantable medical devices, military
applications, automotive control and high volume products such as disk drive electronics). Our proprietary Expert Test
System includes Testability Analysis to provide optimum test ordering, eliminate redundant tests and report on uncovered
areas of the design, all prior to fault simulation. Z01X provides high performance, high capacity fault simulation. Z01X
offers the best overall defect analysis capability in the EDA industry. Our fault models include stuck-at faults, transition
faults and bridge faults.
Z01X Fault Simulator
Z01X is the fastest, highest-capacity fault simulator for functional vectors available bar none. Z01X provides both
logic and fault simulation, and is the only Verilog fault simulator that has the capability of simulating stuck-at faults,
transition faults and bridge faults. Z01X applications include fault simulation of non-scan designs, BIST designs and
scan based designs with functional vectors. Z01X also supports a parallel load methodology for simulating ATPG vectors.
Key Features
- FAST --- Z01X is many times
faster than competing fault simulation products, compare designs fault
simulated by Z01X in 2 days that took the primary competing product 4
weeks.
- POWERFUL --- Our Master/Slave
licensing allows fault simulation tasks to be divided over multiple host
machines to achieve the desired performance.
- ACCURATE --- Good machine
simulation results match the Verilog-XL standard. Fault detection
results match the Verifault standard. Full-timing capability for both
logic and fault simulation including SDF annotation. In tests for
accuracy, Z01X matches ATPG stuck-at detection using ATPG vectors for
all categories (detected, undetected, potential).
- EASY --- No re-modeling of design required with full Verilog language support. Z01X includes automatic
dynamic test ordering optimization, a straightforward fault simulation environment and data management when using multiple servers.
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